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Quanta™ Scanning Electron Microscope  
รหัส : Quanta
รุ่น : Quanta™ Scanning Electron Microscope
รายละเอียดย่อ :
The Quanta line of scanning electron microscopes are versatile, high-performance instruments with three modes (high vacuum, low vacuum and ESEM) to accommodate the widest range of samples of any SEM system. All the Quanta SEM systems can be equipped with analytical systems, such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction.
รายละเอียดทั้งหมด :

In addition, the field emission gun (FEG) systems contain a S/TEM detector for bright-field and dark-field sample imaging. Another variable that changes amongst the SEM systems is the size of the motorized stage (50mm, 100mm, and 150mm) and the motorized z-range (25mm, 60mm, and 65mm, respectively). The Quanta 650 and 650 FEG are each designed with a roomy chamber, enabling the analysis and navigation of large specimens.

The Quanta SEM line now includes even more flexibility with the release of the Quanta 50 Series. These new instruments, the Quanta 250  , 450  , 650  , and 650 FEG  addresss the need to investigate a wide variety of materials and characterize structure and composition. The FEI Quanta™ 50 series provides flexibility and versatility to handle the challenges of today's wide ranging research needs. View any sample and get all the data - surface and compositional images can be combined with accessories for determining material properties and elemental composition.

Quanta 50 Series Scanning Electron Microscopes
 
Quanta 50 Series
The Quanta 50 series adds new features such as SmartSCAN™, Multiple Image Saving and a scan preset toolbar to the easy to use control software. In addition, new features are available like the Nav-Cam™ (color sample camera), Beam Deceleration (low kV performance) and New detector options.
Quanta Morphologi Scanning Electron Microscopes
 
Quanta Morphologi
Quanta Morphologi combines the magnification and resolving power of the FEI Quanta 250 FEG scanning electron microscope (SEM) with established particle analysis software from Malvern Instruments to provide a turn-key solution for particle characterization. As opposed to indirect particle size analysis techniques, which report equivalent spherical diameter, Quanta Morphologi is a direct method to report both size and shape information.



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